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Other articles related with "positive bias stress"：
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128101 |
Dong-Yu Qi(齐栋宇), Dong-Li Zhang(张冬利), Ming-Xiang Wang(王明湘) |
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Positive gate bias stress-induced hump-effect in elevated-metal metal-oxide thin film transistors |
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Chin. Phys. B
2017 Vol.26 (12): 128101-128101
[Abstract]
(594)
[HTML 0 KB]
[PDF 443 KB]
(473)
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77307 |
Qian Hui-Min (钱慧敏), Yu Guang (于广), Lu Hai (陆海), Wu Chen-Fei (武辰飞), Tang Lan-Feng (汤兰凤), Zhou Dong (周东), Ren Fang-Fang (任芳芳), Zhang Rong (张荣), Zheng You-Liao (郑有炓), Huang Xiao-Ming (黄晓明) |
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Temperature-dependent bias-stress-induced electrical instability of amorphous indium-gallium-zinc-oxide thin-film transistors |
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Chin. Phys. B
2015 Vol.24 (7): 77307-077307
[Abstract]
(657)
[HTML 1 KB]
[PDF 552 KB]
(471)
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